Ionscope manufactures Scanning Ion Conductance Microscopes - using patented technology developed by a team of scientists from Imperial College London and Cambridge University. Scanning Ion Conductance Microscopy offers high-resolution topographic imaging of immersed targets with zero force — making SICM the first and only high-resolution imaging technique not to interact/interfere with the sample during image acquisition.
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Relationship Manager:
Jon Page
Management Team:
David Cleevely(Ch)
Noah Freedman (CEO)
Yuri Korchev (Non-Exec Chief Scientist)
Contact Information:
A2 Ash House
Melbourn Science Park
Cambridge Road
Melbourn
SG8 6HB
t: +44 17 6326 9070
f: +44 20 7681 3447
e: sales@ionscope.com
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